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IEC/EN61000-3-2 |
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This standard deals with the limitation of harmonic currents injected
into the public mains supply system. It is applicable to electrical and
electronic equipment having an input current up to and including 16A per
phase and intended to be connected to public low-voltage distribution
systems (ie supply voltages nominally 230V ac or 415V ac 3 phase. Note however that there is a similar US document IEEE-std-519:1992 and the Japanese are proposing a variation for use in Japan. |
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Whilst the EUT is operating under specified conditions, the harmonic content of the current drawn by the EUT is measured. There are currently four sets of limits that are applied corresponding to the ‘class’ of the equipment. Classes are A, B, C or D depending on the type of EUT and, in some cases, the current ‘waveshape’.
The ‘Waveshape’ criteria does not apply to Class B or Class C products. For each class, a set of harmonic limits are specified. Whilst testing the product, the input mains supply should itself be free
of mains harmonics. Limits are specified for the value of allowable harmonic
content in the supply. Typical mains supplies will exceed these limits
thus the use of a special power source to deliver harmonic free mains
is normally required. |
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| The Laplace RFH kit includes all that is required for full compliance testing of products up to 1kW rating. It includes a harmonics and flicker analyser, PC software and a 1kW clean power source. For products with a rating >1kW, the harmonics analyser can be used up to 16A per phase, but the mains supply must be provided either by an appropriate power source or the public mains supply. The analyser includes a function that will measure the mains supply harmonics so that the siutability of the mains can be checked. | ||||||||||
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| Help in the selection of the appropriate measurement techniques and automatic display of the relevant limit levels are standard features in the software provided with all Laplace EMC analysers. Note The above is for guidance only. Refer to the published standard for definitive details, exclusions and exceptions and detailed test technique. | ||||||||||
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Revised: 11 January, 2000 |