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  EMC From Laplace

Product Detail

ScanEMÒ Probes
 




Use ScanEM probes for product design and ScanEM-Q probes for production and QA

Shorten your development schedule and save money on product re-design by using proper EMC tools from the beginning of the project.

ScanEMÒ probes are the most versatile, affordable, and handy instruments for detecting, locating and measuring of electromagnetic emission. Professionals in small and large companies all over the world use ScanEM probes. In the U.S., FCC is using ScanEM-Q probes to enforce compliance with the FCC rules in the field.

ScanEM probes will help you to reliably predict EM behavior of your product and to locate emission sources in a matter of seconds. They detect presence of an electromagnetic field and provide audio and visual indication of its relative strength. ScanEM probes can pinpoint exact sources of emission down to a single trace or component.

Connect ScanEM-C probes to a spectrum analyzer and get the best-performing near-field probes in the industry. ScanEM-C probes have a low-noise amplifier built-in. They provide strong broadband output signal that allows you to see what you have been missing using passive probes.

As ultra-wide bandwidth non-contact voltage and current probes for an oscilloscope, ScanEM-C probes will reveal previously invisible transients. As an EM field probe for a multimeter, ScanEM-C probes provide DC voltage that is a function of the field strength.

 

For graph of performance Click Here

Ordering Information:

Description

Model

ScanEM-C Probe Kit (includes E- and H-Field Probes with RF and DC output), batteries, 6' RF cable, heavy-duty plastic storage enclosure and User's Guide


CTK015

ScanEM Probe Kit (includes E- and H-Field Probes with no output), batteries, heavy-duty plastic storage enclosure and User's Guide


CTK010

 


LAPLACE INSTRUMENTS LTD
3B, Middlebrook Way,
Holt Road, Cromer,
Norfolk, NR27 9JR,
UK
Tel: + 44 (0)1263 515160
Fax: + 44 (0)1263 512532
E-mail:
tech@laplace.co.uk

 
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Revised: 17-Jul-2002
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